There are two selftest scenarios for ARRAY BIST(Board Integrated System
Test) tests:
1. Perform IFS ARRAY BIST tests once on each CPU.
2. Perform IFS ARRAY BIST tests on a random CPU with 3 rounds.
These are not meant to be exhaustive, but are some minimal tests for
for checking IFS ARRAY BIST.
Reviewed-by: Jithu Joseph <jithu.joseph@intel.com>
Reviewed-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com>
Co-developed-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Pengfei Xu <pengfei.xu@intel.com>
Acked-by: Jithu Joseph <jithu.joseph@intel.com>
Signed-off-by: Shuah Khan <skhan@linuxfoundation.org>
IFS (In Field Scan) driver exposes its functionality via sysfs interfaces.
Applications prepare and exercise the tests by interacting with the
aforementioned sysfs files.
Verify that the necessary sysfs entries are created after loading the IFS
driver.
Initialize test variables needed for building subsequent kself-test cases.
Reviewed-by: Jithu Joseph <jithu.joseph@intel.com>
Reviewed-by: Kuppuswamy Sathyanarayanan <sathyanarayanan.kuppuswamy@linux.intel.com>
Co-developed-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Ashok Raj <ashok.raj@intel.com>
Signed-off-by: Pengfei Xu <pengfei.xu@intel.com>
Acked-by: Jithu Joseph <jithu.joseph@intel.com>
Signed-off-by: Shuah Khan <skhan@linuxfoundation.org>
