So far, the SPINAND_PAGE_READ_FROM_CACHE_OP macro was taking a first
argument, "fast", which was inducing the possibility to support higher
bus frequencies than with the normal (slower) read from cache
alternative. In practice, without frequency change on the bus, this was
likely without effect, besides perhaps allowing another variant of the
same command, that could run at the default highest speed. If we want to
support this fully, we need to add a frequency parameter to the slowest
command. But before we do that, let's drop the "fast" boolean from the
macro and duplicate it, this will further help supporting having
different frequencies allowed for each variant.
The change is also of course propagated to all users. It has the nice
effect to have all macros aligned on the same pattern.
Reviewed-by: Tudor Ambarus <tudor.ambarus@linaro.org>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Pull MTD updates from Miquel Raynal:
"Core MTD changes:
- Use refcount to prevent corruption
- Call external _get and _put in right order
- Fix use-after-free in mtd release
- Explicitly include correct DT includes
- Clean refcounting with MTD_PARTITIONED_MASTER
- mtdblock: make warning messages ratelimited
- dt-bindings: Add SEAMA partition bindings
Device driver changes:
- Use devm helper functions
- Fix questionable cast, remove pointless ones.
- error handling fixes
- add support for new chip versions
- update DT bindings
- misc cleanups - fix typos, whitespace, indentation"
* tag 'mtd/for-6.6' of git://git.kernel.org/pub/scm/linux/kernel/git/mtd/linux: (105 commits)
dt-bindings: mtd: amlogic,meson-nand: drop unneeded quotes
mtd: spear_smi: Use helper function devm_clk_get_enabled()
mtd: rawnand: orion: Use helper function devm_clk_get_optional_enabled()
mtd: rawnand: vf610_nfc: Use helper function devm_clk_get_enabled()
mtd: rawnand: sunxi: Use helper function devm_clk_get_enabled()
mtd: rawnand: stm32_fmc2: Use helper function devm_clk_get_enabled()
mtd: rawnand: mtk: Use helper function devm_clk_get_enabled()
mtd: rawnand: mpc5121: Use helper function devm_clk_get_enabled()
mtd: rawnand: lpc32xx_slc: Use helper function devm_clk_get_enabled()
mtd: rawnand: intel: Use helper function devm_clk_get_enabled()
mtd: rawnand: fsmc: Use helper function devm_clk_get_enabled()
mtd: rawnand: arasan: Use helper function devm_clk_get_enabled()
mtd: rawnand: qcom: Add read/read_start ops in exec_op path
mtd: rawnand: qcom: Clear buf_count and buf_start in raw read
mtd: maps: fix -Wvoid-pointer-to-enum-cast warning
mtd: rawnand: fix -Wvoid-pointer-to-enum-cast warning
mtd: rawnand: fsmc: handle clk prepare error in fsmc_nand_resume()
mtd: rawnand: Propagate error and simplify ternary operators for brcmstb_nand_wait_for_completion()
mtd: rawnand: qcom: Sort includes alphabetically
mtd: rawnand: qcom: Do not override the error no of submit_descs()
...
The suffix was changed from "G" to "J" to classify between 1st generation
and 2nd generation serial NAND devices (which now belong to the Kioxia
brand).
As reference that's
1st generation device of 1Gbit product is "TC58CVG0S3HRAIG"
2nd generation device of 1Gbit product is "TC58CVG0S3HRAIJ".
The 8Gbit type "TH58CxG3S0HRAIJ" is new to Kioxia's serial NAND lineup and
the prefix was changed from "TC58" to "TH58".
Thus the functions were renamed from tc58cxgxsx_*() to tx58cxgxsxraix_*().
Signed-off-by: Yoshio Furuyama <ytc-mb-yfuruyama7@kioxia.com>
Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Link: https://lore.kernel.org/linux-mtd/0dedd9869569a17625822dba87878254d253ba0e.1584949601.git.ytc-mb-yfuruyama7@kioxia.com
Currently there are 3 different variants of read_id implementation:
1. opcode only. Found in GD5FxGQ4xF.
2. opcode + 1 addr byte. Found in GD5GxGQ4xA/E
3. opcode + 1 dummy byte. Found in other currently supported chips.
Original implementation was for variant 1 and let detect function
of chips with variant 2 and 3 to ignore the first byte. This isn't
robust:
1. For chips of variant 2, if SPI master doesn't keep MOSI low
during read, chip will get a random id offset, and the entire id
buffer will shift by that offset, causing detect failure.
2. For chips of variant 1, if it happens to get a devid that equals
to manufacture id of variant 2 or 3 chips, it'll get incorrectly
detected.
This patch reworks detect procedure to address problems above. New
logic do detection for all variants separatedly, in 1-2-3 order.
Since all current detect methods do exactly the same id matching
procedure, unify them into core.c and remove detect method from
manufacture_ops.
Tested on GD5F1GQ4UAYIG and W25N01GVZEIG.
Signed-off-by: Chuanhong Guo <gch981213@gmail.com>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Link: https://lore.kernel.org/linux-mtd/20200208074439.146296-1-gch981213@gmail.com
NAND datasheets usually give the maximum number of bad blocks per LUN
and this number can be used to help upper layers decide how much blocks
they should reserve for bad block handling.
Add a max_bad_eraseblocks_per_lun to the nand_memory_organization
struct and update the NAND_MEMORG() macro (and its users) accordingly.
We also provide a default mtd->_max_bad_blocks() implementation.
Signed-off-by: Boris Brezillon <bbrezillon@kernel.org>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de>
