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Creating one module for each compilation unit to be tested seems excessive as the number of tests increase. Group them all in a single kunit test module called xe_test.ko. The tests requiring the physical device, aka "live" tests, are still kept in separate modules since they are normally triggered via igt, and not via kunit.py. After igt is converted, those can be merged in a single module as well. Signed-off-by: Lucas De Marchi <lucas.demarchi@intel.com> Acked-by: Michal Wajdeczko <michal.wajdeczko@intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20231122203147.988021-2-lucas.demarchi@intel.com
16 lines
311 B
Makefile
16 lines
311 B
Makefile
# SPDX-License-Identifier: GPL-2.0
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# "live" kunit tests
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obj-$(CONFIG_DRM_XE_KUNIT_TEST) += \
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xe_bo_test.o \
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xe_dma_buf_test.o \
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xe_migrate_test.o \
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xe_mocs_test.o
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# Normal kunit tests
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obj-$(CONFIG_DRM_XE_KUNIT_TEST) += xe_test.o
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xe_test-y = xe_test_mod.o \
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xe_pci_test.o \
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xe_rtp_test.o \
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xe_wa_test.o
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